Cemil Cem Gürsoy
https://etis.ee/CV/Cemil_Cem_Gursoy/estTeenistuskäik
Töökohad ja ametid
24.11.2017–23.11.2020
Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutisüsteemide instituut, doktorant-nooremteadur (1,00)
Haridustee
2017–...
Ph.D. in Computer and Systems Engineering, Tallinn University of Technology
2015–2017
M.Sc. in Computer Engineering, Yeditepe University
2010–2014
B.Sc. in Electrical and Electronics Engineering, Yeditepe University
Klass
Aasta
Publikatsioon
3.1.
2020
3.4.
2020
3.1.
2019
3.1.
2019
3.1.
2019
3.1.
2019
3.1.
2019
3.1.
2019
3.4.
2019
6.11.2020
Cemil Cem Gürsoy
https://etis.ee/CV/Cemil_Cem_Gursoy/engCareer
Institutions and positions
24.11.2017–23.11.2020
Tallinn University of Technology , School of Information Technologies, Department of Computer Systems, Early Stage Researcher (1,00)
Education
2017–...
Ph.D. in Computer and Systems Engineering, Tallinn University of Technology
2015–2017
M.Sc. in Computer Engineering, Yeditepe University
2010–2014
B.Sc. in Electrical and Electronics Engineering, Yeditepe University
Category
Year
Publication
3.1.
2020
3.4.
2020
3.1.
2019
3.1.
2019
3.1.
2019
3.1.
2019
3.1.
2019
3.1.
2019
3.4.
2019
6.11.2020
- Leitud 9 kirjet
Publikatsioon | Autorid | Aasta | Väljaande pealkiri | Klassifikaator | Fail | Asutused | |
---|---|---|---|---|---|---|---|
A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs | Cardoso Medeiros, Guilherme; Gürsoy, Cemil Cem; Fieback, Moritz, Wu, Lizhou; Jenihhin, Maksim; Taouil, Mottaqiallah; Hamdioui, Said | 2020 | 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) | 3.1. | Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutisüsteemide instituut | ||
A Rescue Demonstrator for Interdependent Aspects of Reliability, Security and Quality Towards a Complete EDA Flow | Nevin George1, Guilherme Cardoso Medeiros2, Junchao Chen3, Josie Esteban Rodriguez Condia4, Thomas Lange5, Aleksa Damljanovic4, Raphael Segabinazzi Ferreira1, Aneesh Balakrishnan5, Xinhui Lai6, Shayesteh Masoumian7, Dmytro Petryk3, Troya Cagil Koylu2, Felipe Augusto da Silva8, Ahmet Cagri Bagbaba8, Cemil Cem Gürsoy6, Said Hamdioui2, Mottaqiallah Taouil2, Milos Krstic3, Peter Langendoerfer3, Zoya Dyka3, Marcelo Brandalero1, Michael Hübner1, Jörg Nolte1, Heinrich Theodor Vierhaus1, Matteo Sonza Reorda4, Giovanni Squillero4, Luca Sterpone4, Jaan Raik6, Dan Alexandrescu5, Maximilien Glorieux5, Georgios Selimis7, Geert-Jan Schrijen7, Anton Klotz8, Christian Sauer8 and Maksim Jenihhin6 | 2020 | 3.4. | Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutisüsteemide instituut | |||
High-Level Automated Deterministic Test Generation for RISC Processors | Oyeniran, Adeboye Stephen; Ubar, Raimund; Jenihhin, Maksim; Gürsoy, Cemil; Raik, Jaan | 2019 | 3.1. | Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutisüsteemide instituut | |||
High-Level Combined Deterministic and Pseudoexhaustive Test Generation for RISC Processors | Oyeniran, Adeboye; Ubar, Raimund; Jenihhin, Maksim; Gursoy, Cemil Cem; Raik, Jaan | 2019 | 2019 24th IEEE European Test Symposium 2019 (ETS19) | 3.1. | Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutisüsteemide instituut | ||
Mixed-level identification of fault redundancy in microprocessors | Ubar, Raimund; Adeboye, Stephan Oveniran; Jenihhin, Maksim; Gürsoy, Cemil Cem; Raik, Jaan. | 2019 | 2019 20th IEEE Latin American Test Symposium (LATS) | 3.1. | Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutisüsteemide instituut | ||
New Categories of Safe Faults in a Processor-Based Embedded System | Gursoy, Cemil Cem; Jenihhin, Maksim; Oyeniran, Stephen; Piumatti, Davide; Raik, Jaan; Sonza Reorda, Matteo; Ubar, Raimund. | 2019 | 2019 22nd IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) | 3.1. | Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutisüsteemide instituut | ||
On NBTI-induced Aging Analysis in IEEE 1687 Reconfigurable Scan Networks | Damljanovic, Aleksa; Gürsoy, Cemil Cem, Squillero, Giovanni; Jenihhin, Maksim | 2019 | 3.1. | Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutisüsteemide instituut | |||
Software-Based Mitigation for Memory Address Decoder Aging | Kraak, Daniel; Gursoy, Cem; Agbo, Innocent; Taouil, Mottaqiallah; Jenihhin, Maksim; Raik, Jaan; Hamdioui, Said. | 2019 | 2019 20th IEEE Latin American Test Symposium (LATS) | 3.1. | Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutisüsteemide instituut | ||
RESCUE EDA Toolset for Interdependent Aspects of Reliability, Security and Quality in Nanoelectronic Systems Design | Gürsoy, Cemil Cem; Cardoso Medeiros, Guilherme; Chen, Junchao; George, Nevin; Rodriguez Condia, Josie Esteban; Lange, Thomas; Damljanovic, Aleksa; Segabinazzi Ferreira, Raphael; Balakrishnan, Aneesh; Lai, Xinhui Anna; Masoumian, Shayesteh; Petryk, Dmytro; Koylu, Troya Cagil; Augusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Hamdioui, Said; Taouil, Mottaqiallah; Krstic, Milos; Langendoerfer, Peter; Dyka, Zoya ... Jenihhin, Maksim | 2019 | University Booth, 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) | 3.4. | Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutisüsteemide instituut |