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Cemil Cem Gürsoy

https://etis.ee/CV/Cemil_Cem_Gursoy/est
26.10.1988
cemil.gursoy@taltech.ee

Teenistuskäik

Töökohad ja ametid
24.11.2017–23.11.2020   
Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutisüsteemide instituut, doktorant-nooremteadur (1,00)
 
 
Haridustee
2017–...   
Ph.D. in Computer and Systems Engineering, Tallinn University of Technology
2015–2017   
M.Sc. in Computer Engineering, Yeditepe University
2010–2014   
B.Sc. in Electrical and Electronics Engineering, Yeditepe University

Publikatsioonid

Klass
Aasta
Publikatsioon
 
3.1.
2020
Cardoso Medeiros, Guilherme; Gürsoy, Cemil Cem; Fieback, Moritz, Wu, Lizhou; Jenihhin, Maksim; Taouil, Mottaqiallah; Hamdioui, Said (2020). A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs. 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE): Design, Automation & Test in Europe Conference & Exhibition (DATE), Grenoble, France, 9 – 13 March, 2020. IEEE Computer Society, [ilmumas].
3.4.
2020
Nevin George1, Guilherme Cardoso Medeiros2, Junchao Chen3, Josie Esteban Rodriguez Condia4, Thomas Lange5, Aleksa Damljanovic4, Raphael Segabinazzi Ferreira1, Aneesh Balakrishnan5, Xinhui Lai6, Shayesteh Masoumian7, Dmytro Petryk3, Troya Cagil Koylu2, Felipe Augusto da Silva8, Ahmet Cagri Bagbaba8, Cemil Cem Gürsoy6, Said Hamdioui2, Mottaqiallah Taouil2, Milos Krstic3, Peter Langendoerfer3, Zoya Dyka3, Marcelo Brandalero1, Michael Hübner1, Jörg Nolte1, Heinrich Theodor Vierhaus1, Matteo Sonza Reorda4, Giovanni Squillero4, Luca Sterpone4, Jaan Raik6, Dan Alexandrescu5, Maximilien Glorieux5, Georgios Selimis7, Geert-Jan Schrijen7, Anton Klotz8, Christian Sauer8 and Maksim Jenihhin6 (2020). A Rescue Demonstrator for Interdependent Aspects of Reliability, Security and Quality Towards a Complete EDA Flow. In: .
3.1.
2019
Ubar, Raimund; Adeboye, Stephan Oveniran; Jenihhin, Maksim; Gürsoy, Cemil Cem; Raik, Jaan. (2019). Mixed-level identification of fault redundancy in microprocessors. 2019 20th IEEE Latin American Test Symposium (LATS): 20th IEEE Latin American Test Symposium, Santiago, Chile, 11th - 13th March 2019. IEEE Computer Society, 1−6.
3.1.
2019
Gursoy, Cemil Cem; Jenihhin, Maksim; Oyeniran, Stephen; Piumatti, Davide; Raik, Jaan; Sonza Reorda, Matteo; Ubar, Raimund. (2019). New Categories of Safe Faults in a Processor-Based Embedded System. 2019 22nd IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS): 22nd IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Cluj-Napoca, Romania, April 24-26, 2019. IEEE Computer Society, 1−4. DOI: 10.1109/DDECS.2019.8724642.
3.1.
2019
Oyeniran, Adeboye Stephen; Ubar, Raimund; Jenihhin, Maksim; Gürsoy, Cemil; Raik, Jaan (2019). High-Level Automated Deterministic Test Generation for RISC Processors. 24th IEEE 24th European Test Symposium, Baden Baden, Germany, May 27-31, 2019. IEEE Computer Science, 1−6.
3.1.
2019
Kraak, Daniel; Gursoy, Cem; Agbo, Innocent; Taouil, Mottaqiallah; Jenihhin, Maksim; Raik, Jaan; Hamdioui, Said. (2019). Software-Based Mitigation for Memory Address Decoder Aging. 2019 20th IEEE Latin American Test Symposium (LATS): 20th IEEE Latin American Test Symposium, Santiago, Chile, 11th - 13th March 2019. IEEE Computer Society, 1−6.
3.1.
2019
Damljanovic, Aleksa; Gürsoy, Cemil Cem, Squillero, Giovanni; Jenihhin, Maksim (2019). On NBTI-induced Aging Analysis in IEEE 1687 Reconfigurable Scan Networks. 27th IFIP/IEEE International Conference on Very Large Scale Integration, Cusco, Peru, October 6-9, 2019. IEEE Computer Society, 355−340. DOI: 10.1109/VLSI-SoC.2019.8920313.
3.1.
2019
Oyeniran, Adeboye; Ubar, Raimund; Jenihhin, Maksim; Gursoy, Cemil Cem; Raik, Jaan (2019). High-Level Combined Deterministic and Pseudoexhaustive Test Generation for RISC Processors. 2019 24th IEEE European Test Symposium 2019 (ETS19): 24th IEEE European Test Symposium 2019 (ETS19), Baden Baden, Germany May 27 – 31, 2019. IEEE Computer Society, 1−6. DOI: 10.1109/ETS.2019.8791526.
3.4.
2019
Gürsoy, Cemil Cem; Cardoso Medeiros, Guilherme; Chen, Junchao; George, Nevin; Rodriguez Condia, Josie Esteban; Lange, Thomas; Damljanovic, Aleksa; Segabinazzi Ferreira, Raphael; Balakrishnan, Aneesh; Lai, Xinhui Anna; Masoumian, Shayesteh; Petryk, Dmytro; Koylu, Troya Cagil; Augusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Hamdioui, Said; Taouil, Mottaqiallah; Krstic, Milos; Langendoerfer, Peter; Dyka, Zoya ... Jenihhin, Maksim (2019). RESCUE EDA Toolset for Interdependent Aspects of Reliability, Security and Quality in Nanoelectronic Systems Design. University Booth, 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE): Design, Automation & Test in Europe Conference & Exhibition (DATE), Florence, Italy, March 25–29, 2019. DATE University Booth. DOI: 10.5281/zenodo.3362529.
6.11.2020

Cemil Cem Gürsoy

https://etis.ee/CV/Cemil_Cem_Gursoy/eng
26.10.1988
cemil.gursoy@taltech.ee

Career

Institutions and positions
24.11.2017–23.11.2020   
Tallinn University of Technology , School of Information Technologies, Department of Computer Systems, Early Stage Researcher (1,00)
 
 
Education
2017–...   
Ph.D. in Computer and Systems Engineering, Tallinn University of Technology
2015–2017   
M.Sc. in Computer Engineering, Yeditepe University
2010–2014   
B.Sc. in Electrical and Electronics Engineering, Yeditepe University

Publications

Category
Year
Publication
 
3.1.
2020
Cardoso Medeiros, Guilherme; Gürsoy, Cemil Cem; Fieback, Moritz, Wu, Lizhou; Jenihhin, Maksim; Taouil, Mottaqiallah; Hamdioui, Said (2020). A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs. 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE): Design, Automation & Test in Europe Conference & Exhibition (DATE), Grenoble, France, 9 – 13 March, 2020. IEEE Computer Society, [forthcoming].
3.4.
2020
Nevin George1, Guilherme Cardoso Medeiros2, Junchao Chen3, Josie Esteban Rodriguez Condia4, Thomas Lange5, Aleksa Damljanovic4, Raphael Segabinazzi Ferreira1, Aneesh Balakrishnan5, Xinhui Lai6, Shayesteh Masoumian7, Dmytro Petryk3, Troya Cagil Koylu2, Felipe Augusto da Silva8, Ahmet Cagri Bagbaba8, Cemil Cem Gürsoy6, Said Hamdioui2, Mottaqiallah Taouil2, Milos Krstic3, Peter Langendoerfer3, Zoya Dyka3, Marcelo Brandalero1, Michael Hübner1, Jörg Nolte1, Heinrich Theodor Vierhaus1, Matteo Sonza Reorda4, Giovanni Squillero4, Luca Sterpone4, Jaan Raik6, Dan Alexandrescu5, Maximilien Glorieux5, Georgios Selimis7, Geert-Jan Schrijen7, Anton Klotz8, Christian Sauer8 and Maksim Jenihhin6 (2020). A Rescue Demonstrator for Interdependent Aspects of Reliability, Security and Quality Towards a Complete EDA Flow. In: .
3.1.
2019
Ubar, Raimund; Adeboye, Stephan Oveniran; Jenihhin, Maksim; Gürsoy, Cemil Cem; Raik, Jaan. (2019). Mixed-level identification of fault redundancy in microprocessors. 2019 20th IEEE Latin American Test Symposium (LATS): 20th IEEE Latin American Test Symposium, Santiago, Chile, 11th - 13th March 2019. IEEE Computer Society, 1−6.
3.1.
2019
Gursoy, Cemil Cem; Jenihhin, Maksim; Oyeniran, Stephen; Piumatti, Davide; Raik, Jaan; Sonza Reorda, Matteo; Ubar, Raimund. (2019). New Categories of Safe Faults in a Processor-Based Embedded System. 2019 22nd IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS): 22nd IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Cluj-Napoca, Romania, April 24-26, 2019. IEEE Computer Society, 1−4. DOI: 10.1109/DDECS.2019.8724642.
3.1.
2019
Oyeniran, Adeboye Stephen; Ubar, Raimund; Jenihhin, Maksim; Gürsoy, Cemil; Raik, Jaan (2019). High-Level Automated Deterministic Test Generation for RISC Processors. 24th IEEE 24th European Test Symposium, Baden Baden, Germany, May 27-31, 2019. IEEE Computer Science, 1−6.
3.1.
2019
Kraak, Daniel; Gursoy, Cem; Agbo, Innocent; Taouil, Mottaqiallah; Jenihhin, Maksim; Raik, Jaan; Hamdioui, Said. (2019). Software-Based Mitigation for Memory Address Decoder Aging. 2019 20th IEEE Latin American Test Symposium (LATS): 20th IEEE Latin American Test Symposium, Santiago, Chile, 11th - 13th March 2019. IEEE Computer Society, 1−6.
3.1.
2019
Damljanovic, Aleksa; Gürsoy, Cemil Cem, Squillero, Giovanni; Jenihhin, Maksim (2019). On NBTI-induced Aging Analysis in IEEE 1687 Reconfigurable Scan Networks. 27th IFIP/IEEE International Conference on Very Large Scale Integration, Cusco, Peru, October 6-9, 2019. IEEE Computer Society, 355−340. DOI: 10.1109/VLSI-SoC.2019.8920313.
3.1.
2019
Oyeniran, Adeboye; Ubar, Raimund; Jenihhin, Maksim; Gursoy, Cemil Cem; Raik, Jaan (2019). High-Level Combined Deterministic and Pseudoexhaustive Test Generation for RISC Processors. 2019 24th IEEE European Test Symposium 2019 (ETS19): 24th IEEE European Test Symposium 2019 (ETS19), Baden Baden, Germany May 27 – 31, 2019. IEEE Computer Society, 1−6. DOI: 10.1109/ETS.2019.8791526.
3.4.
2019
Gürsoy, Cemil Cem; Cardoso Medeiros, Guilherme; Chen, Junchao; George, Nevin; Rodriguez Condia, Josie Esteban; Lange, Thomas; Damljanovic, Aleksa; Segabinazzi Ferreira, Raphael; Balakrishnan, Aneesh; Lai, Xinhui Anna; Masoumian, Shayesteh; Petryk, Dmytro; Koylu, Troya Cagil; Augusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Hamdioui, Said; Taouil, Mottaqiallah; Krstic, Milos; Langendoerfer, Peter; Dyka, Zoya ... Jenihhin, Maksim (2019). RESCUE EDA Toolset for Interdependent Aspects of Reliability, Security and Quality in Nanoelectronic Systems Design. University Booth, 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE): Design, Automation & Test in Europe Conference & Exhibition (DATE), Florence, Italy, March 25–29, 2019. DATE University Booth. DOI: 10.5281/zenodo.3362529.
6.11.2020

Otsi publikatsiooni

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PublikatsioonAutoridAastaVäljaande pealkiriKlassifikaatorFailAsutused
A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMsCardoso Medeiros, Guilherme; Gürsoy, Cemil Cem; Fieback, Moritz, Wu, Lizhou; Jenihhin, Maksim; Taouil, Mottaqiallah; Hamdioui, Said20202020 Design, Automation & Test in Europe Conference & Exhibition (DATE)3.1.Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutisüsteemide instituut
A Rescue Demonstrator for Interdependent Aspects of Reliability, Security and Quality Towards a Complete EDA FlowNevin George1, Guilherme Cardoso Medeiros2, Junchao Chen3, Josie Esteban Rodriguez Condia4, Thomas Lange5, Aleksa Damljanovic4, Raphael Segabinazzi Ferreira1, Aneesh Balakrishnan5, Xinhui Lai6, Shayesteh Masoumian7, Dmytro Petryk3, Troya Cagil Koylu2, Felipe Augusto da Silva8, Ahmet Cagri Bagbaba8, Cemil Cem Gürsoy6, Said Hamdioui2, Mottaqiallah Taouil2, Milos Krstic3, Peter Langendoerfer3, Zoya Dyka3, Marcelo Brandalero1, Michael Hübner1, Jörg Nolte1, Heinrich Theodor Vierhaus1, Matteo Sonza Reorda4, Giovanni Squillero4, Luca Sterpone4, Jaan Raik6, Dan Alexandrescu5, Maximilien Glorieux5, Georgios Selimis7, Geert-Jan Schrijen7, Anton Klotz8, Christian Sauer8 and Maksim Jenihhin620203.4.Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutisüsteemide instituut
High-Level Automated Deterministic Test Generation for RISC ProcessorsOyeniran, Adeboye Stephen; Ubar, Raimund; Jenihhin, Maksim; Gürsoy, Cemil; Raik, Jaan 20193.1.Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutisüsteemide instituut
High-Level Combined Deterministic and Pseudoexhaustive Test Generation for RISC ProcessorsOyeniran, Adeboye; Ubar, Raimund; Jenihhin, Maksim; Gursoy, Cemil Cem; Raik, Jaan20192019 24th IEEE European Test Symposium 2019 (ETS19)3.1.Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutisüsteemide instituut
Mixed-level identification of fault redundancy in microprocessorsUbar, Raimund; Adeboye, Stephan Oveniran; Jenihhin, Maksim; Gürsoy, Cemil Cem; Raik, Jaan.20192019 20th IEEE Latin American Test Symposium (LATS)3.1.Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutisüsteemide instituut
New Categories of Safe Faults in a Processor-Based Embedded SystemGursoy, Cemil Cem; Jenihhin, Maksim; Oyeniran, Stephen; Piumatti, Davide; Raik, Jaan; Sonza Reorda, Matteo; Ubar, Raimund.20192019 22nd IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)3.1.Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutisüsteemide instituut
On NBTI-induced Aging Analysis in IEEE 1687 Reconfigurable Scan NetworksDamljanovic, Aleksa; Gürsoy, Cemil Cem, Squillero, Giovanni; Jenihhin, Maksim20193.1.Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutisüsteemide instituut
Software-Based Mitigation for Memory Address Decoder AgingKraak, Daniel; Gursoy, Cem; Agbo, Innocent; Taouil, Mottaqiallah; Jenihhin, Maksim; Raik, Jaan; Hamdioui, Said.20192019 20th IEEE Latin American Test Symposium (LATS)3.1.Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutisüsteemide instituut
RESCUE EDA Toolset for Interdependent Aspects of Reliability, Security and Quality in Nanoelectronic Systems DesignGürsoy, Cemil Cem; Cardoso Medeiros, Guilherme; Chen, Junchao; George, Nevin; Rodriguez Condia, Josie Esteban; Lange, Thomas; Damljanovic, Aleksa; Segabinazzi Ferreira, Raphael; Balakrishnan, Aneesh; Lai, Xinhui Anna; Masoumian, Shayesteh; Petryk, Dmytro; Koylu, Troya Cagil; Augusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Hamdioui, Said; Taouil, Mottaqiallah; Krstic, Milos; Langendoerfer, Peter; Dyka, Zoya ... Jenihhin, Maksim2019University Booth, 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE)3.4.Tallinna Tehnikaülikool, Infotehnoloogia teaduskond, Arvutisüsteemide instituut